普偌贝斯特 PROBETEST APS 8000用途：适用于半导体测试领域，主要对 300mm 晶圆进行高精度探测测试，可满足逻辑芯片、存储芯片等多种器件的性能检测需求，广泛应用于晶圆制造环节的质量管控。性能：支持 300mm 晶圆测试，探针台定位精度 ±1μm，重复定位精度≤0.5μm。配备多轴联动系统，测试速度达 2000 片 / 小时，支持 - 55℃至 150℃宽温测试范围。采用模块化设计，兼容多种探针卡类型，具备自动校准功能，可有效提升测试效率与准确性。

英文Product Name: PROBETEST APS 8000Purpose: It is applicable to the semiconductor testing field, mainly conducting high-precision probing tests on 300mm wafers. It can meet the performance testing needs of various devices such as logic chips and memory chips, and is widely used in quality control of wafer manufacturing links.Performance: It supports 300mm wafer testing, with probe station positioning accuracy of ±1μm and repeat positioning accuracy of ≤0.5μm. Equipped with a multi-axis linkage system, the testing speed reaches 2000 pieces/hour, supporting a wide temperature testing range of -55℃ to 150℃. Adopting a modular design, it is compatible with various probe card types and has an automatic calibration function, which can effectively improve testing efficiency and accuracy.