东京精密 TOKYO SEIMITSU UF 200AL用途：适用于半导体、电子等行业的晶圆测试，尤其擅长对 5 - 8 英寸晶圆进行性能检测与分析，可用于集成电路的各类测试工作。性能：能稳定处理 5 - 8 英寸晶圆。采用先进的 OTS 光学自动对准技术，综合精度达 ±2um。具备 inkless map、multisite 测试功能，支持最高 150 度的高温测试，可提供高达 200g 的探测力，满足高密度细间距产品的检测需求。专利的十字形 Z 轴设计，让运动更精准，同时降低空转与噪音。自动静电吸盘确保测试表面平整。配备用户友好型软件，支持多种模拟和数字测量，可用于热测试。还拥有卡盘加热器、热卡盘、探针臂等多种可选配件，以提升整体测试效率。

英文Product Name: TOKYO SEIMITSU UF 200ALPurpose: It is applicable to wafer testing in industries such as semiconductors and electronics. It is especially good at performance testing and analysis of 5 - 8 inch wafers and can be used for various testing tasks of integrated circuits.Performance: It can stably handle 5 - 8 inch wafers. It adopts advanced OTS optical automatic alignment technology with a comprehensive accuracy of ±2um. It has functions like inkless map and multisite testing, supports high - temperature testing up to 150 degrees, and can provide a probing force of up to 200g to meet the detection requirements of high - density fine - pitch products. Its patented cross - shaped Z - axis design makes the movement more accurate and reduces idle motion and noise. The automatic electrostatic chuck ensures a flat test surface. The equipped user - friendly software supports various analog and digital measurements and can be used for thermal testing. There are also various optional accessories such as a chuck heater, a hot chuck, probe arms, etc., to improve the overall testing efficiency.