A - PM - 90A 全自动探针台用途：主要用于半导体晶圆的电气性能测试，适用于多种芯片的研发与生产环节，能够对晶圆上的芯片进行高精度的电学参数测量与功能检测，辅助判定芯片是否符合质量标准 。性能：作为东京精密推出的探针台设备，具备较高的自动化程度，可实现高效的晶圆测试流程。虽暂无详细公开参数，但凭借品牌在半导体设备领域的技术积累，其机械结构稳定，能保证测试过程中探针与芯片引脚精准接触，减少测试误差，为芯片性能评估提供可靠数据 。

英文Product Name: A - PM - 90A Fully Automatic Probe StationPurpose: Mainly used for electrical performance testing of semiconductor wafers, suitable for R & D and production processes of various chips. It can perform high-precision electrical parameter measurement and functional testing on the chips on the wafer, assisting in determining whether the chips meet the quality standards.Performance: As a probe station device launched by Tokyo Seimitsu, it has a high degree of automation and can achieve an efficient wafer testing process. Although there are no detailed public parameters, relying on the brand's technical accumulation in the semiconductor equipment field, its mechanical structure is stable, which can ensure the precise contact between the probe and the chip pins during the test, reduce test errors, and provide reliable data for chip performance evaluation.