SEMICS OPUS - II 探针台用途：用于半导体晶圆测试环节，可对 8 英寸、12 英寸晶圆开展性能测试，覆盖逻辑、SoC、存储等半导体产业细分领域，通过精准连接探针与晶圆上的芯片引脚，实现电气性能测试，助力半导体制造企业把控产品质量 。性能：具备出色的精准度，能确保探针与芯片引脚准确对接，降低测试误差。拥有良好的均温稳定性，在测试过程中保持晶圆温度恒定，保障测试环境一致性，提升测试结果可靠性。支持高生产力测试流程，可在单位时间内完成大量晶圆测试，提高生产效率，满足大规模生产需求 。

Product Name: SEMICS OPUS - II ProberPurpose: It is used in the semiconductor wafer testing process. It can conduct performance tests on 8 - inch and 12 - inch wafers, covering sub - fields of the semiconductor industry such as logic, SoC, and memory. By accurately connecting the probes to the chip pins on the wafer, it realizes electrical performance testing, helping semiconductor manufacturing enterprises control product quality.Performance: It has excellent accuracy, ensuring accurate docking between the probes and chip pins, reducing test errors. It has good temperature stability, maintaining a constant wafer temperature during the test, ensuring the consistency of the test environment and improving the reliability of test results. It supports a high - productivity testing process, capable of completing a large number of wafer tests per unit time, improving production efficiency and meeting the needs of large - scale production.