精工 SEIKO SII NANO TECHNOLOGY INC SPI4000 扫描探针显微镜用途：用于纳米尺度的表面成像与分析，在材料科学、半导体研究、生物科学等领域应用广泛。可对材料表面微观结构进行高分辨率观察，辅助科研人员研究材料特性；助力半导体行业检测芯片表面缺陷、分析电路结构；还能用于观察生物样本的微观形貌，为相关研究提供关键数据支持。性能：具备高分辨率成像能力，横向分辨率可达亚纳米级别，能清晰呈现样品表面细微结构。拥有先进的扫描控制技术，扫描范围灵活，可满足不同尺寸样品需求。配备多种扫描模式，如接触模式、非接触模式和轻敲模式等，适应不同性质样品检测。数据采集与处理系统高效，可快速生成高质量图像与分析数据，帮助用户准确解读样品表面信息。

Product Name: SEIKO SII NANO TECHNOLOGY INC SPI4000 Scanning Probe MicroscopePurpose: It is used for surface imaging and analysis at the nanoscale and is widely applied in fields such as materials science, semiconductor research, and bioscience. It can perform high - resolution observation of the microstructure of the material surface, assist researchers in studying material properties, help the semiconductor industry detect surface defects of chips and analyze circuit structures, and also be used to observe the micro - morphology of biological samples, providing key data support for related research.Performance: It has high - resolution imaging capabilities, with a lateral resolution reaching the sub - nanometer level, which can clearly present the fine structure of the sample surface. It has advanced scanning control technology with a flexible scanning range to meet the needs of different - sized samples. It is equipped with a variety of scanning modes, such as contact mode, non - contact mode, and tapping mode, to adapt to the detection of samples with different properties. The data acquisition and processing system is efficient, which can quickly generate high - quality images and analysis data to help users accurately interpret the surface information of the samples.