日立 HITACHI S-7000 扫描电子显微镜用途：广泛应用于纳米技术、半导体、电子、生物、材料科学等领域，可进行样品的微观结构观察与成分分析。技术原理：配备肖特基发射电子枪，发射电子束，经电磁透镜聚焦后轰击样品表面，产生二次电子、背散射电子等信号，由探测器收集并成像。性能：可实现二次电子与背散射电子信号的高效分离与采集；能同时处理、显示及保存多达 6 种信号；最大像素分辨率达 10240×7680；拥有 18 个附件端口；样品仓适用于大尺寸样品，支持多种样品操作及可变压力等条件；电子枪束流最高达 200nA 。Product Name: Hitachi HITACHI S-7000 Scanning Electron MicroscopePurpose: Widely used in fields such as nanotechnology, semiconductors, electronics, biology, and material science for observing the microstructures and analyzing the compositions of samples.Technical Principle: Equipped with a Schottky emitter electron gun, it emits an electron beam which is focused by electromagnetic lenses and bombards the sample surface. Signals like secondary electrons and back - scattered electrons are generated and collected by detectors for imaging.Performance: Enables efficient separation and acquisition of secondary electron and back - scattered electron signals; capable of simultaneously processing, displaying, and saving up to 6 signals; maximum pixel resolution reaches 10240×7680; features 18 accessory ports; the specimen chamber is suitable for large - sized samples and supports various sample manipulations and variable pressure conditions; the electron gun beam current can reach up to 200 nA.