日立 HITACHI S-3200H 扫描电子显微镜用途：适用于材料科学、生命科学、半导体等领域，可对各类样品的微观表面结构进行高分辨率成像观察，帮助科研人员分析样品表面形貌、成分分布等信息。技术原理：通过电子枪发射电子束，经加速、聚焦后轰击样品表面。样品受电子束激发，产生二次电子、背散射电子等信号。设备收集并放大这些信号，从而转化为图像以呈现样品微观特征。性能：加速电压范围为 0.3 - 30 kV；在 30kV 条件下，二次电子像分辨率可达 3.5nm；样品尺寸最大直径 150mm，厚度可达 40mm；配备的电机驱动 xy 样品台可 360° 旋转，倾斜角度为 0° 至 60° 。Product Name: Hitachi HITACHI S-3200H Scanning Electron MicroscopePurpose: It is applicable to fields such as materials science, life science, and semiconductors. It can perform high-resolution imaging and observation of the micro surface structures of various samples, helping researchers analyze information such as sample surface morphology and component distribution.Technical Principle: An electron beam is emitted by the electron gun, accelerated and focused, and then bombards the sample surface. The sample is excited by the electron beam to generate signals such as secondary electrons and backscattered electrons. The device collects and amplifies these signals, and then converts them into images to present the micro characteristics of the sample.Performance: The acceleration voltage ranges from 0.3 - 30 kV. The resolution of the secondary electron image can reach 3.5 nm at 30 kV. The maximum specimen size is 150 mm in diameter and 40 mm in thickness. The motor-driven xy specimen stage can rotate 360° and the tilt angle ranges from 0° to 60°.