日立 HITACHI H-800 透射电子显微镜。用途：适用于纳米材料、高分子材料、介孔材料、金属薄膜、陶瓷及半导体薄膜等的分析研究。可对纳米材料进行形貌与电子衍射分析，观察高分子材料形貌，开展金属薄膜衍衬分析等。搭配拉伸样品台及数字成像系统，能原位观察薄膜样品在应力下微观组织的演化。技术原理：通过电子枪发射电子束，电子束经加速后穿透样品，与样品相互作用产生信号，再经电磁透镜聚焦成像，从而获取样品微观结构信息。性能：加速电压为 200KV 。晶格分辨率达 2.04 埃，点分辨率是 4.5 埃。双倾样品台倾角范围为 x 方向 ±25 度，y 方向 ±25 度。升级改造后加装了 CCD 照相机，提升了成像记录能力 。Product Name：Hitachi HITACHI H - 800 Transmission Electron Microscope.Purpose：It is suitable for the analysis and research of nanomaterials, polymer materials, mesoporous materials, metal films, ceramics, semiconductor films, etc. It can perform morphology and electron diffraction analysis on nanomaterials, observe the morphology of polymer materials, and conduct diffraction contrast analysis of metal films, etc. When equipped with a tensile specimen stage and a digital imaging system, it can in - situ observe the evolution of the microstructure of thin - film samples under stress.Technical Principle：An electron gun emits an electron beam. After being accelerated, the electron beam penetrates the sample and interacts with the sample to generate signals. Then, it is focused and imaged by electromagnetic lenses to obtain the microstructure information of the sample.Performance：The acceleration voltage is 200KV. The lattice resolution reaches 2.04 Å, and the point resolution is 4.5 Å. The inclination angle range of the double - tilt specimen stage is ±25 degrees in the x - direction and ±25 degrees in the y - direction. After the upgrade and transformation, a CCD camera is installed, which improves the imaging and recording ability.