日立 HITACHI S-5200 扫描电子显微镜用途：适用于材料科学、半导体、纳米技术等领域，可进行样品微观形貌观察、结构分析及成分表征，满足科研与工业检测需求。技术原理：通过场发射电子枪发射电子束，经电磁透镜聚焦后轰击样品表面，激发二次电子、背散射电子等信号，探测器收集信号并转化为微观图像。性能：二次电子成像分辨率 1.0nm（30kV）；放大倍数 20 - 100 万倍；加速电压 0.5 - 30kV；样品台承载直径≤120mm 样品，工作距离 8 - 35mm，适配多样品分析场景。Product Name: Hitachi HITACHI S-5200 Scanning Electron MicroscopePurpose: Suitable for fields such as materials science, semiconductors, and nanotechnology. It enables observation of sample micro - morphology, structural analysis, and composition characterization, meeting scientific research and industrial testing needs.Technical Principle: Emits an electron beam via a field emission electron gun, which is focused by electromagnetic lenses and bombards the sample surface, exciting signals like secondary electrons and backscattered electrons. Detectors collect signals and convert them into microscopic images.Performance: Secondary electron imaging resolution is 1.0nm (30kV); magnification range is 20 - 1,000,000 times; acceleration voltage is 0.5 - 30kV; the sample stage carries samples with diameter ≤120mm, working distance 8 - 35mm, adapting to various sample analysis scenarios.