日立 HITACHI S-5500 扫描电子显微镜用途：广泛用于材料科学、半导体、生物学、纳米技术等领域，可观察样品微观形貌、分析结构和成分，助力研究与生产。技术原理：冷场发射电子源发射电子束，经 3 级电磁透镜系统聚焦、加速后轰击样品表面，产生二次电子、背散射电子等信号，探测器收集转化为图像呈现微观特征。性能：二次电子成像分辨率为 0.4nm（30kV）、1.6nm（1kV）；加速电压 0.5 - 30kV；放大倍率在低倍模式下为 60X - 10,000X，高倍模式下为 800 - 2,000,000X；电子图像移动范围为 ±5um（样品高度 = 0mm）；具备多种可选检测器，如上部背散射电子检测器、YAG 型背散射电子检测器、X 射线能谱仪等 。Product Name: Hitachi HITACHI S-5500 Scanning Electron MicroscopePurpose: Widely used in fields such as materials science, semiconductors, biology, and nanotechnology. It can observe the micro - morphology of samples, analyze structures and compositions, and facilitate research and production.Technical Principle: The cold field emission electron source emits an electron beam, which is focused and accelerated by a 3 - stage electromagnetic lens system and then bombards the sample surface. Signals such as secondary electrons and backscattered electrons are generated, and detectors collect and convert them into images to present micro - characteristics.Performance: The resolution of secondary electron imaging is 0.4nm (30kV) and 1.6nm (1kV); the acceleration voltage is 0.5 - 30kV; the magnification is 60X - 10,000X in low - magnification mode and 800 - 2,000,000X in high - magnification mode; the electron image movement range is ±5um (sample height = 0mm); it has a variety of optional detectors, such as the upper backscattered electron detector, YAG - type backscattered electron detector, X - ray energy spectrometer, etc.