日立 HITACHI S-3200N 扫描电子显微镜用途：用于多种材料微观及纳米结构探测，可对金属、非金属、生物样本等各类样品的表面微观形态与结构进行研究，搭配 X 射线能谱仪还能对样品元素定量、定性分析。技术原理：电子枪发射电子，经加速形成高能电子束并聚焦，轰击样品表面，激发二次电子、背散射电子等信号，接收并放大这些信号来成像分析样品。性能：二次电子图像分辨率在 25KV 高真空模式下为 3.0nm ；背散射电子图像分辨率在 25KV 可变压力模式下为 4.5nm；放大倍率 15X - 300,000X（143 级可调）；加速电压 0.3 - 30 kV；最大样品尺寸直径 150mm ；样品台 X 轴 0 - 32mm，Y 轴 0 - 32mm，Z 轴 5 - 35mm，倾斜 - 90° 至 90°，旋转 360°（无级） 。Product Name: Hitachi HITACHI S-3200N Scanning Electron MicroscopePurpose: It is used for probing the micro - and nanostructures of a variety of materials. It can study the surface micro - morphology and structure of various samples such as metals, non - metals, and biological samples. Equipped with an X - ray energy spectrometer, it can also conduct quantitative and qualitative analysis of the elements in the samples.Technical Principle: The electron gun emits electrons, which are accelerated to form a high - energy electron beam and focused. The beam bombards the sample surface, exciting signals such as secondary electrons and backscattered electrons. These signals are received and amplified for imaging and analyzing the sample.Performance: The resolution of the secondary electron image is 3.0 nm in the 25 KV high - vacuum mode; the resolution of the backscattered electron image is 4.5 nm in the 25 KV variable - pressure mode. The magnification is 15X - 300,000X (adjustable in 143 steps). The acceleration voltage is 0.3 - 30 kV. The maximum sample size is 150 mm in diameter. The sample stage has an X - axis range of 0 - 32 mm, a Y - axis range of 0 - 32 mm, a Z - axis range of 5 - 35 mm, a tilt range of - 90° to 90°, and a rotation of 360° (stepless).