日立 HITACHI S-4300SE用途：广泛用于材料科学、生命科学、半导体等领域。可对材料微观结构、生物样品超微形态及半导体芯片细微构造进行观察，还能分析材料表面微区成分。技术原理：采用肖特基场发射电子源，发射电子束，经加速电压加速，由磁透镜聚焦到样品表面，在偏转线圈作用下进行光栅扫描。电子与样品相互作用产生二次电子、背散射电子等信号，探测器收集并转化为电信号，经放大处理成像。性能：二次电子成像分辨率出色，30kV 时为 1.5nm，1kV 时为 5.0nm；放大倍率范围为 20 - 500,000 倍；具备低真空操作功能，真空度范围 10 - 800Pa；拥有环境二次电子探测器（ESED）、YAG 背散射探测器（BSE）、扫描透射探测器（STEM）；样品台为 5 轴电动，X 向行程 0 - 100mm，Y 向行程 0 - 50mm，Z 向行程 5 - 30mm，倾斜角度 - 5° 至 + 60°，旋转角度 360° 。Product Name: Hitachi HITACHI S-4300SEPurpose: It is widely used in fields such as materials science, life sciences, and semiconductors. It can observe the microstructure of materials, the ultrastructure of biological samples, and the fine structure of semiconductor chips, and also analyze the micro-area composition of the material surface.Technical Principle: It uses a Schottky field emission electron source to emit an electron beam. The electron beam is accelerated by the acceleration voltage, focused on the sample surface by the magnetic lens, and undergoes raster scanning under the action of the deflection coil. The electrons interact with the sample to generate signals such as secondary electrons and backscattered electrons. The detector collects these signals and converts them into electrical signals, which are then amplified and processed for imaging.Performance: It has excellent secondary electron imaging resolution, which is 1.5nm at 30kV and 5.0nm at 1kV. The magnification range is 20 - 500,000 times. It has a low - vacuum operation function with a vacuum degree range of 10 - 800Pa. It is equipped with an environmental secondary electron detector (ESED), a YAG backscatter detector (BSE), and a scanning transmission detector (STEM). The sample stage is 5 - axis motorized, with an X - travel of 0 - 100mm, a Y - travel of 0 - 50mm, a Z - travel of 5 - 30mm, a tilt angle of - 5° to + 60°, and a rotation angle of 360°.