日立 HITACHI S-2600H 扫描电子显微镜用途：广泛应用于材料分析、生命科学、半导体研究等领域。能够对金属、陶瓷、生物切片等各类样品进行微观表面结构观察，获取表面形貌、颗粒大小及分布等信息，结合能谱仪还可开展微区化学成分分析。技术原理：电子枪发射电子束，在加速电压作用下，经电子透镜聚焦后扫描样品表面。样品受电子束激发产生二次电子、背散射电子等信号，仪器收集并放大这些信号，将其转化为图像以呈现样品微观特征。性能：加速电压在 0.5 - 30kV 间调节；放大倍率 40X - 300,000X；可变压力范围 1 - 270Pa；二次电子像最高分辨率可达 5nm；具备二次电子（SEs）和背散射电子（BSE）探测器 。Product Name: Hitachi HITACHI S-2600H Scanning Electron MicroscopePurpose: It is widely used in fields such as materials analysis, life sciences, and semiconductor research. It can observe the micro surface structures of various samples like metals, ceramics, and biological sections, obtaining information such as surface morphology, particle size and distribution. In combination with an energy spectrometer, it can conduct micro-area chemical composition analysis.Technical Principle: The electron gun emits an electron beam. Under the action of the acceleration voltage, it is focused by the electron lens and then scans the sample surface. The sample is excited by the electron beam to generate signals such as secondary electrons and backscattered electrons. The instrument collects and amplifies these signals and converts them into images to present the micro characteristics of the sample.Performance: The acceleration voltage can be adjusted in the range of 0.5 - 30 kV. The magnification is 40X - 300,000X. The variable pressure range is 1 - 270 Pa. The maximum resolution of the secondary electron image can reach 5 nm. It is equipped with secondary electron (SEs) and backscattered electron (BSE) detectors.