日立 HITACHI FS100用途：适用于材料内部缺陷检测，在半导体、电子元件、工业材料等领域，助力研发与质量控制环节。可检测金属复合材料的裂纹、气孔，评估焊接与铸造件的缺陷，还能对半导体封装等内部结构成像。技术原理：运用超声波技术，向检测对象发射超声波，利用超声波在不同介质中传播时产生的反射、折射特性，接收反射波并分析处理，从而获取内部结构信息，识别缺陷位置和大小。性能：配备高灵敏度超声波组件，结合高精度扫描仪，能检测细微缺陷。扫描器具备较快扫描速度，利于提升检测效率。设备设有磁性板方便固定细小样品，且软件功能完善，支持图像索引，可补偿测量中的中心位置及试件高度偏差，提升数据可靠性。Product Name: HITACHI FS100Purpose: It is suitable for the inspection of internal defects in materials. It plays a role in R & D and quality control in fields such as semiconductors, electronic components, and industrial materials. It can detect cracks and pores in metal composite materials, evaluate defects in welded and cast parts, and image the internal structures like semiconductor packages.Technical Principle: It uses ultrasonic technology to transmit ultrasonic waves into the inspected object. By taking advantage of the reflection and refraction characteristics of ultrasonic waves when propagating in different media, it receives and analyzes the reflected waves to obtain internal structure information and identify the location and size of defects.Performance: It is equipped with high - sensitivity ultrasonic components and combined with a high - precision scanner, which can detect fine defects. The scanner has a relatively high scanning speed, which helps improve inspection efficiency. The device is equipped with a magnetic plate to facilitate the fixation of small samples, and has a complete software function. It supports image indexing and can compensate for deviations in the center position and specimen height during measurement, improving data reliability.