日立 HITACHI H-600 透射电子显微镜。用途：广泛应用于材料学、生物学、物理学等领域。可用于观察材料微观结构，如金属、陶瓷、纳米材料的内部组织；在生物学中用于研究细胞、病毒等微观生物结构；还能进行晶体结构分析、物相鉴定等。技术原理：通过电子枪发射电子束，电子束经加速后穿透超薄样品，与样品相互作用产生透射电子等信号，再利用电磁透镜对这些信号进行聚焦成像，从而呈现样品的微观结构。性能：加速电压最高可达 100kV，可按 25kV 增量调节 。支持薄膜与数字图像采集。具备多种样品台，如标准、双倾、旋转（测角仪）、低背景（铍制）及低温转移样品台。可在二次电子（SE）、背散射电子（BE）和扫描透射电子（STEM）模式下工作，能同时进行明场和暗场 STEM 成像。分辨率表现优异，15kV 时达 1nm，100kV 时达 2nm，1kV 且开启束减速功能时达 1.4nm（标准金 - 碳测试样品） 。Product Name：Hitachi HITACHI H - 600 Transmission Electron Microscope.Purpose：It is widely used in fields such as materials science, biology, and physics. It can be used to observe the microstructure of materials, such as the internal structure of metals, ceramics, and nanomaterials; used in biology to study the micro - biological structures of cells, viruses, etc.; and can also conduct crystal structure analysis and phase identification.Technical Principle：An electron gun emits an electron beam. After being accelerated, the electron beam penetrates an ultra - thin sample and interacts with the sample to generate signals such as transmitted electrons. Then, electromagnetic lenses are used to focus and image these signals, thus presenting the microstructure of the sample.Performance：The acceleration voltage can reach up to 100kV and can be adjusted in 25kV increments. It supports film and digital image acquisition. It has a variety of specimen holders, such as standard, dual - tilt, rotational (goniometer), low - background (beryllium), and cryotransfer specimen holders. It can operate in secondary electron (SE), backscattered electron (BE), and scanning transmission electron (STEM) modes, and can perform simultaneous bright - field and dark - field STEM imaging. It has excellent resolution performance, reaching 1nm at 15kV, 2nm at 100kV, and 1.4nm at 1kV with beam deceleration (standard gold - on - carbon test specimen).