赛默飞 FEI Nova NanoSEM 600 场发射扫描电子显微镜用途：适用于纳米材料研究与开发、半导体器件分析、生物样品微观观察、材料微观结构表征等领域，可进行高分辨率成像与微观分析 。技术原理：采用场发射电子枪产生高亮度电子束，电子束经电磁透镜聚焦扫描样品表面，与样品相互作用产生二次电子、背散射电子等信号，探测器收集转化为图像。结合浸入式透镜技术和 FEI Helix 探测技术，能在低真空环境抑制电荷积累及电子束诱导污染 。性能：二次电子图象分辨率，30kV 时达 0.8nm（STEM 探测器）；背散射电子图像分辨率，10kV 时为 1.5nm（Helix 探测器）。加速电压 200V - 30kV 连续可调。具备超高分辨率成像（浸入模式）与高分辨率成像（无场模式）。样品台为五轴，行程 150mm，样品室大，可容纳直径 15cm、厚几厘米样品。可实现纳米级二次电子、背散射电子和扫描透射电子成像 。Product Name: Thermo Fisher FEI Nova NanoSEM 600 Field Emission Scanning Electron MicroscopePurpose: It is applicable to fields such as nanomaterial research and development, semiconductor device analysis, microscopic observation of biological samples, and material microstructure characterization. It can perform high - resolution imaging and microscopic analysis.Technical Principle: It uses a field emission electron gun to generate a high - brightness electron beam. The electron beam is focused by electromagnetic lenses and scans the sample surface. The interaction with the sample generates signals such as secondary electrons and backscattered electrons, which are collected by detectors and converted into images. Combining immersion lens technology and FEI Helix detection technology can suppress charge accumulation and electron beam - induced contamination in a low - vacuum environment.Performance: The resolution of secondary electron images reaches 0.8nm at 30kV (STEM detector); the resolution of backscattered electron images is 1.5nm at 10kV (Helix detector). The acceleration voltage is continuously adjustable from 200V to 30kV. It has ultra - high - resolution imaging (immersion mode) and high - resolution imaging (field - free mode). The sample stage is a five - axis stage with a travel of 150mm. The sample chamber is large and can accommodate samples with a diameter of 15cm and a thickness of several centimeters. It can achieve nanoscale secondary electron, backscattered electron, and scanning transmission electron imaging.