日立 HITACHI S-2500 扫描电子显微镜用途：适用于材料科学、生物学、半导体等领域。能对金属、陶瓷、生物切片等各类样品进行微观表面结构观察，获取表面形貌、颗粒大小及分布等信息。搭配能谱仪可开展微区化学成分分析。技术原理：电子枪发射电子束，在加速电压作用下，经电子透镜聚焦后扫描样品表面。样品受电子束激发产生二次电子、背散射电子等信号，仪器收集并放大这些信号，转化为图像呈现样品微观特征。性能：加速电压 0.5 - 30 kV；二次电子像分辨率在高分辨率模式下可达 2.5nm；最大放大倍率 200,000X；配备 Lab6 灯丝、2 个聚光镜、二次电子（闪烁体 - 光电倍增管）探测器、背散射电子（固态）探测器及透射电子探测器等 。Product Name: Hitachi HITACHI S-2500 Scanning Electron MicroscopePurpose: It is applicable to fields such as materials science, biology, and semiconductors. It can observe the micro surface structures of various samples like metals, ceramics, and biological sections, obtaining information such as surface morphology, particle size and distribution. Equipped with an energy spectrometer, it can conduct micro - area chemical composition analysis.Technical Principle: The electron gun emits an electron beam. Under the action of the acceleration voltage, it is focused by the electron lens and then scans the sample surface. The sample is excited by the electron beam to generate signals such as secondary electrons and backscattered electrons. The instrument collects and amplifies these signals and converts them into images to present the micro characteristics of the sample.Performance: The acceleration voltage is 0.5 - 30 kV. The resolution of the secondary electron image can reach 2.5 nm in the high - resolution mode. The maximum magnification is 200,000X. It is equipped with a Lab6 filament, 2 condenser lenses, a secondary electron (scintillator - photomultiplier) detector, a backscattered electron (solid - state) detector, and a transmitted electron detector, etc.