赛默飞 FEI Quanta 200 FEG 场发射扫描电子显微镜用途：适用于材料、生物、地质、半导体等众多领域。可用于观察材料微观结构、生物样品精细特征、地质样品矿物颗粒以及半导体器件缺陷等，辅助科研分析与质量检测工作。技术原理：通过场发射电子枪发射高亮度电子束，电子束经电磁透镜聚焦后扫描样品表面，与样品相互作用产生二次电子、背散射电子等信号，探测器收集这些信号并转化为图像。具备高真空、低真空和环境真空（ESEM）三种模式，能适应各类样品，如非导电、含水或不稳定样品 。性能：二次电子成像分辨率，高真空模式下 30kV 时可达 1.2nm、1kV 时为 3.0nm；低真空模式 30kV 时 1.4nm、3kV 时 3.0nm；环境真空模式 30kV 时 1.5nm 。背散射电子成像 30kV 时分辨率 2.5nm 。放大倍数在高、低真空模式下均为 12×～1,000,000× 。加速电压范围 200V～30kV 。样品台具备五轴，X、Y 方向移动范围 100mm 。可配备多种探测器用于成分分析等 。Product Name: Thermo Fisher FEI Quanta 200 FEG Field Emission Scanning Electron MicroscopePurpose: It is applicable to numerous fields such as materials, biology, geology, and semiconductors. It can be used to observe the microstructure of materials, the fine features of biological samples, the mineral particles of geological samples, and the defects of semiconductor devices, assisting in scientific research analysis and quality inspection work.Technical Principle: A high - brightness electron beam is emitted by a field emission electron gun. The electron beam is focused by electromagnetic lenses and then scans the sample surface, interacting with the sample to generate signals such as secondary electrons and backscattered electrons. These signals are collected by detectors and converted into images. It has three modes: high vacuum, low vacuum, and environmental vacuum (ESEM), which can adapt to various samples, such as non - conductive, hydrated, or unstable samples.Performance: For secondary electron imaging resolution, in high - vacuum mode, it can reach 1.2nm at 30kV and 3.0nm at 1kV; in low - vacuum mode, it is 1.4nm at 30kV and 3.0nm at 3kV; in environmental vacuum mode, it is 1.5nm at 30kV. The resolution of backscattered electron imaging is 2.5nm at 30kV. The magnification is 12× to 1,000,000× in both high - and low - vacuum modes. The acceleration voltage range is 200V to 30kV. The sample stage has five axes with a movement range of 100mm in both the X and Y directions. It can be equipped with a variety of detectors for composition analysis, etc.