赛默飞 FEI TECNAI G2 F20 X-TWIN 场发射透射电子显微镜用途：用于材料科学、纳米技术、生命科学等领域。在材料领域分析微观结构与成分；纳米技术中表征纳米材料；生命科学里观察生物样本超微结构，助力科研与质量检测。技术原理：运用场发射电子枪产生高亮度、高相干性电子束，电子束穿透样品后，通过电磁透镜聚焦成像，搭配能谱仪和电子能量损失谱仪，基于电子与样品作用产生的特征 X 射线及能量损失进行成分和结构分析 。性能：加速电压 120 - 200kV 。点分辨率达 0.27nm，STEM 线分辨率约 0.34nm 。配备多种探测器，如高角环形暗场探测器用于 Z 衬度成像；能谱仪可分析元素，分辨率 136eV（Mn K-alpha 辐射） 。样品台标准低背景双倾 holder 下可实现 40° 倾斜，搭配断层扫描 holder 能达 ±70° 倾斜 。Product Name: Thermo Fisher FEI TECNAI G2 F20 X - TWIN Field Emission Transmission Electron MicroscopePurpose: It is used in fields such as materials science, nanotechnology, and life sciences. In the materials field, it analyzes the microstructure and composition; in nanotechnology, it characterizes nanomaterials; in life sciences, it observes the ultrastructure of biological samples, facilitating scientific research and quality inspection.Technical Principle: It uses a field emission electron gun to generate a high - brightness and high - coherency electron beam. After the electron beam penetrates the sample, it is focused and imaged through electromagnetic lenses. Equipped with an energy spectrometer and an electron energy loss spectrometer, it conducts composition and structure analysis based on the characteristic X - rays and energy loss generated by the interaction between electrons and the sample.Performance: The acceleration voltage is 120 - 200kV. The point resolution reaches 0.27nm, and the STEM line resolution is approximately 0.34nm. It is equipped with a variety of detectors, such as a high - angle annular dark - field detector for Z - contrast imaging. The energy spectrometer can analyze elements with a resolution of 136eV (Mn K - alpha radiation). The sample stage can achieve a 40° tilt with a standard low - background double - tilt holder and ±70° tilt with a tomography holder.