赛默飞 FEI Quanta 200 FEG MKII 场发射扫描电子显微镜用途：适用于材料、生物、地质等多领域。可用于观察材料微观结构、生物样品精细特征、地质样品矿物颗粒等，辅助科研分析与质量检测工作 。技术原理：通过场发射电子枪产生高亮度电子束，电子束经电磁透镜聚焦后扫描样品表面，与样品相互作用产生二次电子、背散射电子等信号，探测器收集并转化为图像。具备高真空、低真空和环境真空（ESEM）三种模式，能适应不同样品，如非导电、含水或不稳定样品 。性能：二次电子成像分辨率，高真空模式下 30kV 时达 1.2nm、1kV 时为 3.0nm；低真空模式 30kV 时 1.5nm、3kV 时 3.0nm；环境真空模式 30kV 时 1.5nm。背散射电子成像 30kV 时分辨率 2.5nm 。放大倍数在高、低真空模式下均为 12×～1,000,000× 。加速电压范围 200V～30kV 。样品台具备五轴，X、Y 方向移动范围 100mm 。还配备牛津–link inca 350 X 射线光谱仪，可进行轻元素检测、光谱成像和相分析 。Product Name: Thermo Fisher FEI Quanta 200 FEG MKII Field Emission Scanning Electron MicroscopePurpose: It is applicable to multiple fields such as materials, biology, and geology. It can be used to observe the microstructure of materials, the fine features of biological samples, the mineral particles of geological samples, etc., assisting in scientific research analysis and quality inspection work.Technical Principle: A high - brightness electron beam is generated by a field emission electron gun. The electron beam is focused by electromagnetic lenses and then scans the sample surface, interacting with the sample to generate signals such as secondary electrons and backscattered electrons. These signals are collected by detectors and converted into images. It has three modes: high vacuum, low vacuum, and environmental vacuum (ESEM), which can adapt to different samples, such as non - conductive, hydrated, or unstable samples.Performance: For secondary electron imaging resolution, in high - vacuum mode, it reaches 1.2nm at 30kV and 3.0nm at 1kV; in low - vacuum mode, it is 1.5nm at 30kV and 3.0nm at 3kV; in environmental vacuum mode, it is 1.5nm at 30kV. The resolution of backscattered electron imaging is 2.5nm at 30kV. The magnification is 12× to 1,000,000× in both high - and low - vacuum modes. The acceleration voltage range is 200V to 30kV. The sample stage has five axes with a movement range of 100mm in both the X and Y directions. It is also equipped with an Oxford –link inca 350 X - ray spectrometer, which can perform light element detection, spectral imaging, and phase analysis.