日立 HITACHI FS-200 Type II用途：用于材料及产品内部缺陷的高精度检测，如半导体、电子元件、工业材料等，可在研发、质量控制等环节发挥重要作用。技术原理：运用超声波技术，发射特定频率超声波进入检测对象，利用超声波在不同介质传播时的反射、折射特性，接收反射波并分析处理，以获取内部结构信息，识别缺陷位置与大小。性能：配置最高频率达 500MHz 的宽带、高灵敏度超声波组件，搭配高精度扫描仪，能检测最小间距 0.5μm 的细微缺陷。扫描仪最大扫描速度 1000mm/s，可实现高速批量测量。设备有效行程（X×Y×Z）为 350×350×80mm ，具备多种超声波数据分析软件，助力精准评估检测结果。Product Name: HITACHI FS-200 Type IIPurpose: It is used for high-precision inspection of internal defects in materials and products, such as semiconductors, electronic components, and industrial materials, and can play an important role in R & D, quality control and other links.Technical Principle: It uses ultrasonic technology to transmit ultrasonic waves of specific frequencies into the inspected object. By utilizing the reflection and refraction characteristics of ultrasonic waves when propagating in different media, it receives the reflected waves and analyzes and processes them to obtain internal structure information and identify the location and size of defects.Performance: It is equipped with broadband and high-sensitivity ultrasonic components with a maximum frequency of 500MHz, and is combined with a high-precision scanner, which can detect fine defects with a minimum pitch of 0.5μm. The maximum scanning speed of the scanner is 1000mm/s, enabling high-speed batch measurement. The effective stroke (X×Y×Z) of the equipment is 350×350×80mm. It has a variety of ultrasonic data analysis software to assist in accurately evaluating the inspection results.