赛默飞 FEI XL 30 扫描电子显微镜用途：可用于材料微观结构观测、半导体缺陷分析、生物样品观察、地质样品研究等多领域。在材料领域助力分析材料特性；半导体领域检测电路问题；生物领域呈现细胞形态；地质领域探究岩石矿物特征 。技术原理：通过钨丝发射电子形成电子束，电子束经电磁透镜聚焦后扫描样品表面。电子与样品相互作用产生二次电子、背散射电子等信号，探测器收集这些信号，经处理转化为样品表面图像。具备可变压力环境扫描技术，可在不同气压下观察样品 。性能：加速电压范围 1 - 30kV 。高真空模式下，二次电子像分辨率可达 1.2nm（30kV 时）。样品台为五轴电动，X、Y 方向移动范围各 50mm，Z 方向 20mm ；倾斜角度手动调节范围 - 10° 至 + 60°，旋转角度电动可达 n×360°。可配备背散射电子探测器（BSE）、能谱仪（EDX）等进行成分分析 。Product Name: Thermo Fisher FEI XL 30 Scanning Electron MicroscopePurpose: It can be used in multiple fields such as material microstructure observation, semiconductor defect analysis, biological sample observation, and geological sample research. In the materials field, it helps analyze material properties; in the semiconductor field, it detects circuit problems; in the biological field, it shows cell morphology; in the geological field, it explores the characteristics of rocks and minerals.Technical Principle: Electrons are emitted by a tungsten filament to form an electron beam, which is focused by electromagnetic lenses and then scans the sample surface. Electrons interact with the sample to generate signals such as secondary electrons and backscattered electrons. These signals are collected by detectors and processed into images of the sample surface. It has variable pressure environmental scanning technology, allowing sample observation under different air pressures.Performance: The acceleration voltage range is 1 - 30kV. In high - vacuum mode, the resolution of secondary electron images can reach 1.2nm (at 30kV). The sample stage is a five - axis motorized stage, with a movement range of 50mm in both the X and Y directions and 20mm in the Z direction. The tilt angle can be manually adjusted in the range of - 10° to + 60°, and the rotation angle can be electrically adjusted up to n×360°. It can be equipped with a backscattered electron detector (BSE), an energy - dispersive spectrometer (EDX), etc. for composition analysis.