日立 HITACHI 5500M（以 AFM5500M 原子力显微镜为例）用途：用于材料微观结构观测，助力科研人员研究材料表面形貌、粗糙度等特性，在材料科学、纳米技术等领域应用广泛。技术原理：利用微小探针与样品表面的相互作用力，将力信号转化为电信号成像。搭载全新平板扫描器，能实现无扭曲的高精度测量与大范围水平扫描。性能：最大样品尺寸为直径 100mm、厚度 20mm；扫描范围达 200µm x 200µm x 15µm；RMS 噪音水平≤ 0.04nm（高分辨率模式）；复位精度 XY≤15nm (3σ、计量 10µm 的标准间距) ，Z 为 1nm (3σ、计量 100nm 的标准深度) 。可实现 AFM、DFM 等多种测试模式 。Product Name: Hitachi HITACHI 5500M (Taking AFM5500M atomic force microscope as an example)Purpose: It is used for observing the microstructure of materials, helping researchers study the surface morphology, roughness and other characteristics of materials. It is widely used in fields such as materials science and nanotechnology.Technical Principle: It uses the interaction force between a tiny probe and the sample surface to convert the force signal into an electrical signal for imaging. Equipped with a new flat scanner, it can achieve high - precision measurement without distortion and large - range horizontal scanning.Performance: The maximum sample size is 100mm in diameter and 20mm in thickness; The scanning range reaches 200µm x 200µm x 15µm; The RMS noise level is ≤ 0.04nm (high - resolution mode); The reset accuracy is XY ≤ 15nm (3σ, measuring the standard pitch of 10µm), and Z is 1nm (3σ, measuring the standard depth of 100nm). Multiple test modes such as AFM and DFM can be realized.