日立 HITACHI S-2380N 扫描电子显微镜用途：广泛应用于材料科学、生物学、半导体等领域。可用于观察金属、陶瓷、生物切片等各类样品的微观表面结构，获取表面形貌、颗粒大小及分布等信息。结合能谱仪，还能开展微区化学成分分析。技术原理：电子枪发射电子束，在加速电压作用下，经电磁透镜聚焦后扫描样品表面。样品受电子束激发，产生二次电子、背散射电子等信号。仪器收集并放大这些信号，转化为图像呈现样品微观特征。性能：加速电压范围 0.5 - 30kV；二次电子像分辨率在高分辨率模式下可达 3nm；放大倍率最高 200,000X；具备二次电子探测器用于成像，还可配置背散射电子探测器及能谱仪等拓展功能；可在高真空或低真空（1 - 270Pa）环境下工作 。Product Name: Hitachi HITACHI S-2380N Scanning Electron MicroscopePurpose: It is widely used in fields such as materials science, biology, and semiconductors. It can be used to observe the micro surface structures of various samples like metals, ceramics, and biological sections, obtaining information such as surface morphology, particle size and distribution. In combination with an energy spectrometer, it can conduct micro - area chemical composition analysis.Technical Principle: The electron gun emits an electron beam. Under the action of the acceleration voltage, it is focused by electromagnetic lenses and then scans the sample surface. The sample is excited by the electron beam to generate signals such as secondary electrons and backscattered electrons. The instrument collects and amplifies these signals and converts them into images to present the micro characteristics of the sample.Performance: The acceleration voltage ranges from 0.5 - 30 kV. The resolution of the secondary electron image can reach 3 nm in the high - resolution mode. The maximum magnification is 200,000X. It is equipped with a secondary electron detector for imaging and can also be configured with a backscattered electron detector, an energy spectrometer, and other extended functions. It can work in a high - vacuum or low - vacuum (1 - 270 Pa) environment.