赛默飞 FEI Quanta 400 扫描电子显微镜用途：广泛用于材料、生物、地质、半导体等领域，可对材料微观结构、生物样品细微特征、地质样品矿物颗粒等进行观察分析，辅助科研与质量检测工作 。技术原理：通过电子枪发射电子束，经电磁透镜聚焦后扫描样品表面，电子与样品相互作用产生二次电子、背散射电子等信号，探测器收集这些信号并转化为图像。具备三种真空模式，高真空用于常规高分辨率成像；低真空可观察未镀膜非导电样品；环境真空（ESEM）能观察含水或不稳定样品 。性能：二次电子成像分辨率，高真空模式下 30kV 时达 1.2nm、1kV 时为 3.0nm；低真空模式 30kV 时 1.5nm、3kV 时 3.0nm；环境真空模式 30kV 时 1.5nm。背散射电子成像 30kV 时分辨率 2.5nm 。放大倍数在高、低真空模式下均为 12×～1,000,000× 。加速电压范围 200V～30kV 。样品室内径 379mm，样品台具备五轴，X、Y 方向移动范围 100mm 。Product Name: Thermo Fisher FEI Quanta 400 Scanning Electron MicroscopePurpose: It is widely used in fields such as materials, biology, geology, and semiconductors. It can observe and analyze the microstructure of materials, the fine features of biological samples, the mineral particles of geological samples, etc., assisting in scientific research and quality inspection work.Technical Principle: An electron beam is emitted by an electron gun, focused by electromagnetic lenses, and then scans the sample surface. The interaction between electrons and the sample generates signals such as secondary electrons and backscattered electrons. These signals are collected by detectors and converted into images. It has three vacuum modes. High vacuum is used for conventional high - resolution imaging; low vacuum can observe uncoated non - conductive samples; environmental vacuum (ESEM) can observe hydrated or unstable samples.Performance: For secondary electron imaging resolution, in high - vacuum mode, it reaches 1.2nm at 30kV and 3.0nm at 1kV; in low - vacuum mode, it is 1.5nm at 30kV and 3.0nm at 3kV; in environmental vacuum mode, it is 1.5nm at 30kV. The resolution of backscattered electron imaging is 2.5nm at 30kV. The magnification is 12× to 1,000,000× in both high - and low - vacuum modes. The acceleration voltage range is 200V to 30kV. The inner diameter of the sample chamber is 379mm, and the sample stage has five axes with a movement range of 100mm in both the X and Y directions.