日立 HITACHI S-570 扫描电子显微镜用途：在材料科学、生物学、半导体等多领域广泛应用，可用于观察样品微观形貌，分析内部结构，还能辅助进行成分检测，助力科研与工业生产。技术原理：电子枪发射电子束，电子束经电磁透镜聚焦、加速后轰击样品表面。电子与样品相互作用产生二次电子、背散射电子等信号，探测器收集并转化为图像，呈现样品微观特征。性能：二次电子图像分辨率可达 2.5nm；放大倍数 20 - 10 万倍（标准样品台，工作距离 35mm），12 - 10 万倍（大尺寸样品台，工作距离 60mm）；加速电压 0.5 - 3kV 以 100V 为步长，3 - 30kV 以 1kV 为步长；最大束流 300μA ；可处理最大直径 150mm 样品 。Product Name: Hitachi HITACHI S-570 Scanning Electron MicroscopePurpose: Widely used in multiple fields such as materials science, biology, and semiconductors. It can be used to observe the micro - morphology of samples, analyze internal structures, and assist in composition detection, facilitating scientific research and industrial production.Technical Principle: The electron gun emits an electron beam. The beam is focused and accelerated by electromagnetic lenses and then bombards the sample surface. Electrons interact with the sample to generate signals such as secondary electrons and backscattered electrons. Detectors collect and convert these signals into images to present the micro - characteristics of the sample.Performance: The resolution of secondary electron images can reach 2.5nm; magnification is 20 - 100,000 times (standard specimen stage, working distance 35mm) and 12 - 100,000 times (large - sized specimen stage, working distance 60mm); acceleration voltage ranges from 0.5 - 3kV in 100V steps and 3 - 30kV in 1kV steps; maximum beam current is 300μA; can handle samples with a maximum diameter of 150mm.