日立 HITACHI S-5000用途：适用于材料科学、生物学、半导体等多领域研究，可用于观察材料微观结构、生物样品超微形态、半导体芯片细微构造等，助力分析样品特性与相关制造工艺。技术原理：采用场发射电子枪发射电子束，电子束扫描样品表面，与样品相互作用产生二次电子、背散射电子等信号，探测器收集并转化为图像，呈现样品微观特征。性能：30kV 加速电压下，二次电子像分辨率可达 0.6nm，1kV 时为 2.5nm；放大倍率在低倍模式下为 30 - 500 倍，高倍模式为 250 - 800,000 倍；加速电压范围 0.5 - 30kV，以 0.1kV 为步长调节；样品台为侧入式，标准样品 holder 下，样品尺寸最大 9.5mm×5mm×2.4mm，大样品 holder 下为 20mm×6mm×2.4mm；具备多种信号检测模式 。Product Name: Hitachi HITACHI S-5000Purpose: It is suitable for research in multiple fields such as materials science, biology, and semiconductors. It can be used to observe the microstructure of materials, the ultrastructure of biological samples, the fine structure of semiconductor chips, etc., helping to analyze sample characteristics and related manufacturing processes.Technical Principle: It uses a field emission electron gun to emit an electron beam. The electron beam scans the sample surface and interacts with the sample to generate signals such as secondary electrons and backscattered electrons. The detector collects and converts these signals into images to present the microscopic characteristics of the sample.Performance: At an acceleration voltage of 30kV, the resolution of the secondary electron image can reach 0.6nm, and at 1kV it is 2.5nm. The magnification is 30 - 500 times in low magnification mode and 250 - 800,000 times in high magnification mode. The acceleration voltage ranges from 0.5 - 30kV and can be adjusted in steps of 0.1kV. The sample stage is of side - entry type. With a standard sample holder, the maximum sample size is 9.5mm×5mm×2.4mm, and with a large sample holder, it is 20mm×6mm×2.4mm. It has a variety of signal detection modes.