日立 HITACHI S-3400N 扫描电子显微镜用途：用于生物及非生物材料的表面结构及元素组成分析，可观察各类样品，如金属、非金属、生物制样等。技术原理：电子枪发射电子，经加速形成高能电子束，聚焦后入射样品表面，激发产生二次电子、背散射电子等信号，接收、放大这些信号成像，以分析样品。性能：二次电子像分辨率在 30KV 高真空模式下为 3.0nm，3KV 高真空模式下为 10nm；背散射电子像分辨率在 30KV 低真空模式下为 4.0nm；放大倍率 5X - 300,000X；加速电压 0.3 - 30 kV；低真空范围 6 - 270 Pa；最大样品尺寸直径 200mm 。Product Name: Hitachi HITACHI S-3400N Scanning Electron MicroscopePurpose: It is used for the analysis of the surface structure and elemental composition of biological and non-biological materials. It can observe various types of samples, such as metals, non-metals, and biological samples.Technical Principle: The electron gun emits electrons, which are accelerated to form a high-energy electron beam. After focusing, it is incident on the sample surface, exciting signals such as secondary electrons and backscattered electrons. These signals are received and amplified for imaging to analyze the sample.Performance: The resolution of the secondary electron image is 3.0 nm in the high vacuum mode at 30 KV and 10 nm in the high vacuum mode at 3 KV. The resolution of the backscattered electron image is 4.0 nm in the low vacuum mode at 30 KV. The magnification is 5X - 300,000X. The acceleration voltage is 0.3 - 30 kV. The low vacuum range is 6 - 270 Pa. The maximum sample size is 200 mm in diameter.