日立 HITACHI S-3000N 扫描电子显微镜用途：广泛应用于材料、金属、生物学、医学、化学等多领域。可用于各类样品微观形貌观察分析，如纳米结构催化材料、涂层材料、固态样品表面等；也能进行微区化学成分定性与定量检测。技术原理：电子枪发射电子束，在加速电压作用下，经电子透镜聚焦后扫描样品表面，激发二次电子、背散射电子等信号。收集并放大这些信号，转化为对应图像以呈现样品微观特征。性能：加速电压 0.3 - 30 kV；二次电子像分辨率在 25 kV 高真空模式下为 3.5nm；背散射电子像分辨率在 25 kV 可变压力模式下为 5.0nm；放大倍率 15× - 300,000×；可变压力范围 1 - 270 Pa；最大样品尺寸直径 150mm、高 20mm；样品台 X 向 100mm、Y 向 50mm、Z 向 5 - 40mm，倾斜 0 - 60 度，可 360 度旋转 。Product Name: Hitachi HITACHI S-3000N Scanning Electron MicroscopePurpose: It is widely used in various fields such as materials, metals, biology, medicine, and chemistry. It can be used for the observation and analysis of the micro - morphology of various samples, such as nanostructured catalytic materials, coating materials, and the surface of solid samples. It can also conduct qualitative and quantitative detection of micro - area chemical components.Technical Principle: The electron gun emits an electron beam. Under the action of the acceleration voltage, it is focused by the electron lens and then scans the sample surface, exciting signals such as secondary electrons and backscattered electrons. These signals are collected and amplified and then converted into corresponding images to present the micro - characteristics of the sample.Performance: The acceleration voltage is 0.3 - 30 kV. The resolution of the secondary electron image is 3.5 nm in the 25 kV high - vacuum mode. The resolution of the backscattered electron image is 5.0 nm in the 25 kV variable - pressure mode. The magnification is 15× - 300,000×. The variable - pressure range is 1 - 270 Pa. The maximum sample size is 150 mm in diameter and 20 mm in height. The sample stage has an X - direction of 100 mm, a Y - direction of 50 mm, a Z - direction of 5 - 40 mm, a tilt of 0 - 60 degrees, and can rotate 360 degrees.