日立 HITACHI S-520 扫描电子显微镜用途：适用于材料科学、生物学、半导体等领域，可观察样品微观形貌，辅助分析结构与成分，满足基础科研和常规工业检测需求。技术原理：电子枪发射电子束，经电磁透镜聚焦、加速后轰击样品表面，电子与样品作用产生二次电子、背散射电子等信号，探测器收集信号并转化为微观图像。性能：二次电子成像分辨率 8nm（25kV）；放大倍数 20 - 10 万倍；加速电压 0.5 - 25kV；样品台可承载直径≤100mm 样品，工作距离 10 - 30mm，适配常规样品分析。Product Name: Hitachi HITACHI S-520 Scanning Electron MicroscopePurpose: Suitable for fields such as materials science, biology, and semiconductors. It can observe sample micro - morphology, assist in analyzing structures and compositions, meeting basic scientific research and routine industrial testing needs.Technical Principle: The electron gun emits an electron beam, which is focused and accelerated by electromagnetic lenses and bombards the sample surface. Electrons interact with the sample to generate signals like secondary electrons and backscattered electrons. Detectors collect signals and convert them into microscopic images.Performance: Secondary electron imaging resolution is 8nm (25kV); magnification range is 20 - 100,000 times; acceleration voltage is 0.5 - 25kV; the sample stage can carry samples with diameter ≤100mm, working distance 10 - 30mm, adapting to routine sample analysis.