日立 HITACHI HL-8000M 扫描电子显微镜。用途：用于对样品表面和亚表面进行详细分析的先进成像设备，可应用于材料科学、生物学等领域5。技术原理：通过电子枪发射电子束，照射样品产生信号，经电子光学系统收集放大，在显示屏上形成图像。利用能谱仪（EDS）和波谱仪（WDS）探测器，通过记录电子束照射样品产生的 X 射线信号进行元素分析5。性能：放大倍数最高可达 50000 倍，分辨率为 0.5 纳米。配备五轴载物台，可实现样品全区域导航。具备先进成像单元，单色器可提高小于 2 微米样品特征的对比度。还拥有专利聚焦离子束（FIB）技术，可进行高精度样品切割和亚表面成像5。Product Name: Hitachi HITACHI HL - 8000M Scanning Electron Microscope.Purpose: It is an advanced imaging device for detailed analysis of the surface and subsurface of samples, which can be applied to materials science, biology and other fields5.Technical Principle: The electron gun emits an electron beam that irradiates the sample to generate signals. These signals are collected and amplified by the electron - optical system and form an image on the display screen. The energy - dispersive spectrometry (EDS) and wavelength - dispersive spectrometry (WDS) detectors are used to perform elemental analysis by recording the X - ray signals generated by the electron beam irradiating the sample5.Performance: The maximum magnification can reach 50,000 times, and the resolution is 0.5 nanometers. It is equipped with a five - axis stage for full - area sample navigation. It has an advanced imaging unit, and the monochromator can improve the contrast of sample features less than 2 microns. It also has a patented focused ion beam (FIB) technology, which can be used for high - precision sample cutting and subsurface imaging5.