日本电子 JEOL JSM - T500F 扫描电子显微镜用途：用于对导电和非导电样品进行高分辨率成像以及定性 X 射线微分析。技术原理：电子束在加速电压作用下，从灯丝（阴极）经阳极孔流入透镜系统，通过调节栅极偏压调节束流，电子束在栅极偏压作用下汇聚成第一个汇聚点。电子束照射样品表面，激发出电子，探头收集电子信息调制成像。性能：放大倍数范围在 5 倍至 20000 倍。高真空模式（压力范围 10⁻² - 10⁻⁴Pa）用于导电样品高分辨率成像，分辨率可达 4.0nm（30kV 背散射电子探测器）；低真空模式 / 可变压力（10 - 150 帕斯卡）用于非导电样品成像和分析，分辨率为 3.0nm（30kV）、15.0nm（1.0kV） 。Product Name: JEOL JSM - T500F Scanning Electron MicroscopePurpose: It is used for high - resolution imaging and qualitative X - ray microanalysis of conductive and non - conductive samples.Technical Principle: Under the action of the accelerating voltage, the electron beam flows from the filament (cathode) through the anode hole into the lens system. The beam current is adjusted by adjusting the grid bias voltage, and the electron beam converges into the first convergence point under the action of the grid bias voltage. The electron beam irradiates the sample surface, exciting electrons, and the probe collects the electron information for modulation imaging.Performance: The magnification range is from 5x to 20,000x. High - vacuum mode (pressure range 10⁻² - 10⁻⁴Pa) is used for high - resolution imaging of conductive samples, with a resolution of up to 4.0nm (30kV BED). Low - vacuum mode / variable pressure (10 - 150 Pascals) is used for imaging and analysis of non - conductive samples, with a resolution of 3.0nm (30kV) and 15.0nm (1.0kV).