冷场发射扫描电子显微镜 JSM - 7500用途：广泛用于材料科学、生物等领域，可进行样品微观形貌观察、结构分析及成分测试。技术原理：配备场发射电子枪和半浸没式物镜，电子束轰击样品表面，产生二次电子和背散射电子成像。性能：分辨率 1.0nm（15kV）、1.4nm（1kV）；加速电压 0.1 - 30kV；放大倍数 25 - 100 万倍；可操控直径 200mm、高 10mm 样品。Product Name: Cold Field Emission Scanning Electron Microscope JSM - 7500Purpose: Widely used in fields such as materials science and biology for observing the micro - morphology of samples, structural analysis, and composition testing.Technical Principle: Equipped with a field emission electron gun and a semi - in - lens objective. The electron beam bombards the sample surface to generate secondary electrons and backscattered electrons for imaging.Performance: Resolution is 1.0nm (15kV), 1.4nm (1kV); acceleration voltage is 0.1 - 30kV; magnification is 25 - 1,000,000 times; can handle samples with a diameter of 200mm and a height of 10mm.