赛默飞 FEI QOANTA450 扫描电子显微镜用途：用于材料微观结构观察、半导体器件检测、地质样品分析等领域，可获取样品表面高分辨率图像，辅助研究与质量控制。技术原理：通过场发射电子枪发射电子束，电子束扫描样品表面，激发出二次电子、背散射电子等信号，探测器收集这些信号并转化为图像信息。具备可变压力样品腔真空技术，能适应不同样品测试需求。性能：分辨率出色，在高真空下可清晰呈现细微结构。加速电压连续可调，范围从 200V 至 30kV 。可进行定性和定量化学分析，借助能量色散 X 射线光谱（EDX）实现图像采集、X 射线光谱映射和线扫描；通过电子背散射衍射（EBSD）获取结构和晶体学信息，如晶体取向、位错等，实现准确的相识别和相映射。样品台 X、Y 方向移动范围达 100mm 。Product Name: Thermo Fisher FEI QOANTA450 Scanning Electron MicroscopePurpose: It is used in fields such as material microstructure observation, semiconductor device inspection, and geological sample analysis. It can obtain high-resolution images of the sample surface to assist research and quality control.Technical Principle: An electron beam is emitted by a field emission electron gun and scans the sample surface, exciting signals such as secondary electrons and backscattered electrons. These signals are collected by detectors and converted into image information. It has a variable pressure specimen chamber vacuum technology that can adapt to the testing requirements of different samples.Performance: It has an excellent resolution and can clearly show fine structures under high vacuum. The acceleration voltage is continuously adjustable, ranging from 200V to 30kV. It can perform qualitative and quantitative chemical analysis. Image acquisition, X-ray spectral mapping, and line scanning are achieved by energy dispersive X-ray spectroscopy (EDX). Structural and crystallographic information, such as crystal orientation and misorientation, can be obtained through electron backscattered diffraction (EBSD) to achieve accurate phase identification and phase mapping. The sample stage has a movement range of 100mm in both the X and Y directions.