东京精密 TOKYO SEIMITSU APM-90AF用途：适用于精密制造领域，可对金属、陶瓷等材料的小型精密零件进行三维形状与表面粗糙度测量，广泛应用于模具、光学元件等行业的质量检测环节。性能：测量范围 X:90mm、Y:90mm、Z:50mm，线性精度 ±(0.5+1L/1000)μm（L 单位：mm）。配备激光扫描与白光干涉复合探头，表面粗糙度测量分辨率达 0.1nm，扫描速度 400 点 / 秒。采用气浮轴承结构，X/Y 轴定位精度 ±0.6μm，支持自动聚焦，可高效完成复杂曲面零件的高精度检测。

英文Product Name: TOKYO SEIMITSU APM-90AFPurpose: It is applicable to the field of precision manufacturing, capable of 3D shape and surface roughness measurement of small precision parts made of metal, ceramics and other materials, and widely used in quality inspection links of mold, optical component and other industries.Performance: The measurement range is X:90mm, Y:90mm, Z:50mm, with linear accuracy of ±(0.5+1L/1000)μm (L unit: mm). Equipped with a composite probe of laser scanning and white light interference, the surface roughness measurement resolution reaches 0.1nm, and the scanning speed is 400 points/second. Adopting an air bearing structure, the X/Y axis positioning accuracy is ±0.6μm, supporting automatic focusing, which can efficiently complete high-precision inspection of complex curved parts.