尼康 NIKON AMI-3500 晶圆缺陷检测设备，专为半导体晶圆质量管控设计。通过高分辨率光学系统与先进算法，可精准识别晶圆表面及内部的微缺陷（如颗粒、划痕、图案异常等），支持大尺寸晶圆高速检测，提供缺陷分类与数据分析，助力提升芯片制程良率。

Nikon NIKON AMI-3500 wafer defect inspection equipment is designed for semiconductor wafer quality control. Equipped with a high-resolution optical system and advanced algorithms, it can accurately identify micro-defects on and inside the wafer (such as particles, scratches, pattern anomalies, etc.). It supports high-speed inspection of large-size wafers, provides defect classification and data analysis, and helps improve chip manufacturing yield.