尼康 NIKON L300 显微镜用途：适用于大尺寸液晶显示器（LCD）和晶圆的精密检测，在半导体制造中可对 300mm 晶圆及掩模进行检查，也满足平板显示后端检测需求 。性能：采用尼康独有的 CFI60 光学系统，分辨率高、对比度佳且透光率良好，相比传统显微镜大幅提升了图像亮度 。物镜齐焦距 60mm，兼顾高数值孔径与长工作距离，光学同心度改善，减少了物镜倍率切换时的图像偏移 。配备电动通用型六孔物镜转换器，有三个可定心插槽，切换物镜时能瞬间切断照明以保护使用者眼睛 。通过对物镜特殊镀膜和优化表面，减少杂散光，降低光斑影响，实现高对比度成像 。支持 Nomarski DIC 观察，采用单棱镜系统，在所有倍率下仅插入单个诺马斯基棱镜即可进行 DIC 观察，图像清晰且色彩过渡自然 。观察倍率 15X - 3000X（依目镜和物镜组合而定），主机刚性高，具备防尘、防污染、防静电功能，操作便捷 。

Product Name: Nikon NIKON L300 MicroscopePurpose: Suitable for the precision inspection of large - size LCDs and wafers. It can be used to inspect 300 - mm wafers and masks in semiconductor manufacturing and also meets the needs of flat - panel display backend inspection.Performance: It adopts Nikon's unique CFI60 optical system, featuring high resolution, good contrast, and excellent light transmittance. The image brightness is significantly improved compared to traditional microscopes. The parfocal distance of the objective lens is 60mm, taking into account both high numerical aperture and long working distance. The optical centricity has been improved, reducing image shift when switching objective magnifications. Equipped with a motorized universal sextuple nosepiece with three centerable slots, the illumination can be cut off instantly when switching objectives to protect the user's eyes. By applying special coatings to the objectives and optimizing their surfaces, stray light is reduced, minimizing the impact of flare and achieving high - contrast imaging. It supports Nomarski DIC observation. With a single - prism system, DIC observation can be carried out at all magnifications by simply inserting a single Nomarski prism. The images are clear with natural color transitions. The observation magnification ranges from 15X to 3000X (depending on the combination of the eyepiece and objective). The main unit has high rigidity and has functions of dust - proof, pollution - proof, and anti - static, with convenient operation.