日本理学 RIGAKU 3700H用途：为 X 射线衍射仪，适用于高分子材料、薄膜、催化剂等领域，用于晶体结构分析、物相鉴定及取向度测定，助力材料性能研究与质量管控。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪控制角度，探测器采集衍射强度数据，经分析获取材料微观结构信息。性能：X 射线管功率 18kW；测角仪精度 ±0.0001°；扫描速度 0.01°-100°/min 可调；配备高分辨率探测器，支持薄膜样品分析，数据重现性好。

Product Name: RIGAKU 3700HPurpose: It is an X-ray diffractometer, suitable for polymer materials, thin films, catalysts and other fields. It is used for crystal structure analysis, phase identification and orientation determination, aiding material performance research and quality control.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer controls the angle, and the detector collects diffraction intensity data. The microstructure information of materials is obtained through analysis.Performance: X-ray tube power 18kW; goniometer accuracy ±0.0001°; scanning speed adjustable from 0.01°-100°/min; equipped with high-resolution detector, supporting thin film sample analysis, with good data reproducibility.