西门子 SIEMENS D 500用途：适用于材料科学、地质、化工等领域，用于粉末 X 射线衍射分析，可进行物相鉴定、晶体结构测定及定量分析，助力材料研究与质量控制。技术原理：基于 X 射线衍射（XRD）技术，X 射线照射样品后与晶体原子相互作用产生衍射，不同晶体结构对应特定衍射图案，仪器通过检测分析这些图案确定材料的晶体结构、物相组成等信息。性能：配备铜靶 X 射线管，功率 2.2kW；测角仪角度重现性达 ±0.001°；扫描速度 0.001-20°/min 可调；支持多样品类型分析，软件可自动数据处理并生成报告，操作简便高效。

Product Name: SIEMENS D 500Purpose: Suitable for materials science, geology, chemical industry and other fields. It is used for powder X-ray diffraction analysis, and can perform phase identification, crystal structure determination and quantitative analysis, aiding material research and quality control.Technical Principle: Based on X-ray diffraction (XRD) technology, X-rays interact with crystal atoms to produce diffraction after irradiating the sample. Different crystal structures correspond to specific diffraction patterns. The instrument determines the crystal structure and phase composition of materials by detecting and analyzing these patterns.Performance: Equipped with a copper target X-ray tube with 2.2kW power; the goniometer has an angle reproducibility of ±0.001°; the scanning speed is adjustable from 0.001-20°/min; it supports analysis of various sample types, and the software can automatically process data and generate reports, with convenient and efficient operation.