日本理学 RIGAKU 3630 XRF用途：为波长色散型 X 射线荧光光谱仪，适用于半导体、电子、环境等领域，用于固体、薄膜及液体样品中微量至常量元素分析，助力纯度检测与污染控制。技术原理：基于 X 射线荧光技术，X 射线激发样品产生特征荧光，经晶体分光后，探测器测量特定波长荧光强度，结合标准曲线实现元素定性与定量分析。性能：检测元素范围从硼（B）至铀（U）；X 射线管功率 300W；检出限低至 0.0005%；配备 6 位自动样品台，单次分析时间 4-8 分钟，长期稳定性 RSD≤0.2%。

Product Name: RIGAKU 3630 XRFPurpose: It is a wavelength dispersive X-ray fluorescence spectrometer, suitable for semiconductor, electronics, environment and other fields. It is used for trace to major element analysis in solid, thin film and liquid samples, aiding purity detection and pollution control.Technical Principle: Based on X-ray fluorescence technology, X-rays excite samples to produce characteristic fluorescence. After being dispersed by crystals, the detector measures the intensity of fluorescence at specific wavelengths, and realizes qualitative and quantitative analysis of elements combined with standard curves.Performance: Detectable element range from boron (B) to uranium (U); X-ray tube power 300W; detection limit as low as 0.0005%; equipped with 6-position automatic sample stage, single analysis time 4-8 minutes, long-term stability RSD≤0.2%.