菲尼克斯 PHOENIX Micromex SE 160T用途：为 X 射线微区分析设备，常用于材料研究、半导体检测、文物保护等领域，可对样品微小区域进行元素分析与成分检测，助力微观层面的质量把控与科研探索。技术原理：基于电子束激发 X 射线荧光技术，聚焦电子束轰击样品表面微小区域，使元素发射特征 X 射线，通过探测器收集并分析 X 射线的能量与强度，确定元素种类及含量。性能：空间分辨率达 1μm；加速电压 5-30kV 连续可调；束流范围 1pA - 1μA；可检测元素从硼（B）至铀（U）；配备高灵敏度探测器，分析速度快，数据准确性高。

Product Name: PHOENIX Micromex SE 160TPurpose: It is an X-ray microanalysis device, often used in materials research, semiconductor inspection, cultural relics protection and other fields. It can perform elemental analysis and composition detection on small areas of samples, aiding in micro-level quality control and scientific research exploration.Technical Principle: Based on the electron beam excited X-ray fluorescence technology, the focused electron beam bombards a small area on the sample surface, causing elements to emit characteristic X-rays. The detector collects and analyzes the energy and intensity of the X-rays to determine the types and contents of elements.Performance: Spatial resolution up to 1μm; acceleration voltage continuously adjustable from 5 - 30kV; beam current range 1pA - 1μA; detectable elements from boron (B) to uranium (U); equipped with a high-sensitivity detector, with fast analysis speed and high data accuracy.