日本理学 RIGAKU SmartLab 3用途：为多功能 X 射线衍射仪，适用于材料科学、纳米技术、能源等领域，用于晶体结构分析、物相鉴定、织构与应力测量及小角散射研究，支持多维度材料表征。技术原理：基于 X 射线衍射与散射原理，通过高精度测角系统控制 X 射线源与探测器角度，采集样品衍射 / 散射信号，结合专用软件解析材料微观结构信息。性能：测角仪精度 ±0.0001°；最大扫描速度 200°/min；配备 9kW 密封管或 18kW 旋转阳极 X 射线源；支持同步辐射级数据采集，兼容多种样品形态，自动化操作程度高。

Product Name: RIGAKU SmartLab 3Purpose: It is a multi-functional X-ray diffractometer, suitable for materials science, nanotechnology, energy and other fields. It is used for crystal structure analysis, phase identification, texture and stress measurement, and small-angle scattering research, supporting multi-dimensional material characterization.Technical Principle: Based on the principles of X-ray diffraction and scattering, the angle of X-ray source and detector is controlled by a high-precision goniometer system to collect sample diffraction/scattering signals, and the microstructure information of materials is analyzed with special software.Performance: Goniometer accuracy ±0.0001°; maximum scanning speed 200°/min; equipped with 9kW sealed tube or 18kW rotating anode X-ray source; supports synchrotron radiation-level data collection, compatible with various sample forms, and has a high degree of automated operation.