布鲁克 BRUKER FR590 小角 X 射线散射仪用途：适用于聚合物、胶体与纳米材料领域，对纳米级结构进行表征，可分析颗粒尺寸分布、孔隙率及分子链结构，满足材料微观结构研究与质量控制需求。技术原理：利用聚焦 X 射线照射样品，纳米结构引发小角度散射，探测器捕捉散射信号，结合散射理论计算结构参数，实现纳米尺度结构的定量分析。性能：散射角范围 0.02°-60°，空间分辨率 0.5μm。配备 Cu 靶 X 射线源，光束尺寸 30μm，检测限低至 0.5nm。样品台支持 - 196℃至 400℃温控，数据采集时间 3-30 分钟。

Product Name: Bruker BRUKER FR590 Small-Angle X-ray Scattering SystemUsage: Suitable for polymers, colloids and nanomaterials, characterizing nanoscale structures. It can analyze particle size distribution, porosity and molecular chain structure, meeting needs for material microstructure research and quality control.Technical Principle: Irradiates samples with focused X-rays, nanoscale structures cause small-angle scattering. Detector captures scattering signals, calculates structural parameters based on scattering theory to realize quantitative analysis of nanoscale structures.Performance: Scattering angle range 0.02°-60°, spatial resolution 0.5μm. Equipped with Cu target X-ray source, beam size 30μm, detection limit as low as 0.5nm. Sample stage supports -196℃ to 400℃ temperature control, data collection time 3-30 minutes.