布鲁克 BRUKER Skyscan 1173 微焦点 X 射线计算机断层扫描系统用途：适用于材料科学、生物学领域，对小型样品进行三维结构成像，可分析复合材料内部结构、生物组织微观形态，满足无损检测与微观结构研究需求。技术原理：通过微焦点 X 射线源照射样品，旋转台带动样品 360° 转动，探测器同步采集多角度投影数据，经断层重建算法生成三维断层图像，实现内部结构可视化。性能：X 射线源电压 40-130kV，电流 20-100μA，焦点尺寸 5-8μm。空间分辨率≤1.4μm，扫描视野直径最大 80mm，最大样品高度 100mm。扫描时间 10-60 分钟，支持自动重建，输出三维模型可量化分析。

Product Name: Bruker BRUKER Skyscan 1173 Microfocus X-ray Computed Tomography SystemUsage: Suitable for materials science and biology, performing 3D structural imaging of small samples. It can analyze internal structures of composite materials and micro-morphology of biological tissues, meeting needs for non-destructive testing and microstructural research.Technical Principle: Irradiates samples with microfocus X-ray source, rotating stage drives samples to rotate 360°, detector synchronously collects multi-angle projection data, generates 3D tomographic images via tomographic reconstruction algorithms to realize internal structure visualization.Performance: X-ray source voltage 40-130kV, current 20-100μA, focal spot size 5-8μm. Spatial resolution ≤1.4μm, maximum scanning field diameter 80mm, maximum sample height 100mm. Scanning time 10-60 minutes, supports automatic reconstruction, output 3D models for quantitative analysis.