日本理学 RIGAKU TXRF 3750用途：为全反射 X 射线荧光光谱仪，适用于半导体、环境、生物医药等领域，用于微量及痕量元素分析，可检测液体、固体表面的超微量元素，助力纯度检测与污染分析。技术原理：基于全反射 X 射线荧光技术，X 射线以临界角入射样品表面发生全反射，减少背景散射，激发样品产生特征荧光，通过高分辨率探测器检测荧光能量与强度实现元素分析。性能：检测元素范围从钠（Na）至铀（U）；检出限低至 1pg（固体）、1ppt（液体）；分析时间短至 3 分钟；样品需求量少（μL 级），配备自动进样系统，适合批量分析。

Product Name: RIGAKU TXRF 3750Purpose: It is a total reflection X-ray fluorescence spectrometer, suitable for semiconductor, environmental, biomedicine and other fields. It is used for trace and ultra-trace element analysis, capable of detecting ultra-trace elements on liquid and solid surfaces, aiding purity testing and pollution analysis.Technical Principle: Based on total reflection X-ray fluorescence technology, X-rays incident on the sample surface at a critical angle undergo total reflection, reducing background scattering, exciting the sample to produce characteristic fluorescence. Elemental analysis is achieved by detecting fluorescence energy and intensity with a high-resolution detector.Performance: Detectable element range from sodium (Na) to uranium (U); detection limit as low as 1pg (solid), 1ppt (liquid); analysis time as short as 3 minutes; small sample requirement (μL level), equipped with automatic sampling system, suitable for batch analysis.