日本理学 RIGAKU Miniflex用途：为台式 X 射线衍射仪，适用于教学、基础科研、工业快速检测等领域，用于物相鉴定、结晶度分析及简单晶体结构研究，支持粉末样品检测。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，测角仪控制角度，探测器采集衍射强度数据，经分析获取晶体结构信息。性能：测角仪精度 ±0.05°；扫描速度 0.01°-30°/min 可调；配备 10W 微焦 X 射线管；体积小巧，操作简单，单次分析时间≤20 分钟。

Product Name: RIGAKU MiniflexPurpose: It is a benchtop X-ray diffractometer, suitable for teaching, basic scientific research, industrial rapid detection and other fields. It is used for phase identification, crystallinity analysis and simple crystal structure research, supporting powder sample detection.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer controls the angle, and the detector collects diffraction intensity data. Crystal structure information is obtained through analysis.Performance: Goniometer accuracy ±0.05°; scanning speed adjustable from 0.01°-30°/min; equipped with a 10W microfocus X-ray tube; compact in size, easy to operate, single analysis time ≤20 minutes.