日本理学 RIGAKU MiniFlex Plus用途：为台式 X 射线衍射仪，适用于教学、科研、材料开发等领域，用于物相鉴定、结晶度分析及小角散射研究，支持粉末、薄膜等样品检测。技术原理：基于 X 射线衍射原理，X 射线照射样品产生衍射信号，通过测角仪控制角度，探测器采集衍射强度数据，经分析获取材料晶体结构信息。性能：测角仪精度 ±0.02°；扫描速度 0.01°-60°/min 可调；配备 30W 微焦 X 射线管；体积小巧，支持自动进样，单次分析时间≤10 分钟。

Product Name: RIGAKU MiniFlex PlusPurpose: It is a benchtop X-ray diffractometer, suitable for teaching, scientific research, material development and other fields. It is used for phase identification, crystallinity analysis and small-angle scattering research, supporting detection of powder, thin film and other samples.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate samples to generate diffraction signals. The goniometer controls the angle, and the detector collects diffraction intensity data. Material crystal structure information is obtained through analysis.Performance: Goniometer accuracy ±0.02°; scanning speed adjustable from 0.01°-60°/min; equipped with a 30W microfocus X-ray tube; compact in size, supports automatic sampling, single analysis time ≤10 minutes.