菲尼克斯 PHOENIX Micromex 160用途：为 X 射线微区分析设备，适用于电子、材料、地质等领域，用于微小区域元素成分分析与分布检测，助力微观结构研究与质量管控。技术原理：基于电子束激发 X 射线荧光技术，聚焦电子束轰击样品微区，元素释放特征 X 射线，探测器采集能量与强度信号，分析确定元素种类及含量。性能：空间分辨率达 1μm；加速电压 5-25kV 可调；束流范围 1pA-1μA；检测元素从硼（B）至铀（U）；配备高灵敏度探测器，分析速度快，数据稳定性好。

Product Name: PHOENIX Micromex 160Purpose: It is an X-ray microanalysis device, suitable for electronics, materials, geology and other fields. It is used for elemental composition analysis and distribution detection in small areas, aiding microstructure research and quality control.Technical Principle: Based on electron beam excited X-ray fluorescence technology, the focused electron beam bombards the sample's micro-area, elements release characteristic X-rays. The detector collects energy and intensity signals, and analyzes to determine element types and contents.Performance: Spatial resolution up to 1μm; acceleration voltage adjustable from 5-25kV; beam current range 1pA-1μA; detectable elements from boron (B) to uranium (U); equipped with high-sensitivity detector, with fast analysis speed and good data stability.