日本理学 RIGAKU X310用途：为 X 射线衍射仪，适用于材料科学、地质、化工等领域，用于晶体结构分析、物相鉴定及结晶度测定，助力科研与工业材料特性研究。技术原理：基于 X 射线衍射原理，X 射线照射晶体样品产生特定方向衍射光束，探测器记录衍射角度与强度，通过分析衍射图谱确定晶体结构。性能：X 射线管功率 3kW；测角仪精度 ±0.001°；扫描速度 0.01°-50°/min 可调；配备高灵敏度探测器，支持多种样品形态，数据采集效率高。

Product Name: RIGAKU X310Purpose: It is an X-ray diffractometer, suitable for materials science, geology, chemical industry and other fields. It is used for crystal structure analysis, phase identification and crystallinity determination, aiding scientific research and industrial material property studies.Technical Principle: Based on the principle of X-ray diffraction, X-rays irradiate crystal samples to generate diffraction beams in specific directions. The detector records the diffraction angle and intensity, and the crystal structure is determined by analyzing the diffraction pattern.Performance: X-ray tube power 3kW; goniometer accuracy ±0.001°; scanning speed adjustable from 0.01°-50°/min; equipped with high-sensitivity detector, supporting various sample forms, with high data collection efficiency.