是德科技 KEYSIGHT 5400 5DX X 射线检测系统用途：适用于电子制造中高端生产线，对高密度 PCB 组件、复杂半导体封装进行精密检测，可识别微焊点缺陷、BGA/CSP 空洞及多层结构异常，满足高可靠性产品质量管控需求。技术原理：采用多视角 X 射线发射与 3D 断层合成技术，利用材料吸收差异生成分层图像，智能算法消除层间干扰，精准呈现内部微观结构与缺陷。性能：配备 120kV 微焦点 X 射线管，焦点尺寸 5μm，空间分辨率＜1μm。200 万像素探测器，检测速度达 300mm/s。最大样品尺寸 510×460mm，支持 70° 倾斜与 360° 旋转，AI 辅助缺陷分类，误报率＜0.5%。

Product Name: Keysight KEYSIGHT 5400 5DX X-ray Inspection SystemUsage: Suitable for mid-to-high-end electronics production lines, conducting precision inspection of high-density PCB assemblies and complex semiconductor packages. It identifies micro solder defects, BGA/CSP voids and multi-layer structure abnormalities, meeting quality control needs of high-reliability products.Technical Principle: Adopts multi-view X-ray emission and 3D tomosynthesis, generates layered images based on material absorption differences. Intelligent algorithms eliminate interlayer interference to accurately present internal microstructures and defects.Performance: Equipped with 120kV micro-focus X-ray tube, focal spot size 5μm, spatial resolution ＜1μm. 2-megapixel detector, inspection speed up to 300mm/s. Max sample size 510×460mm, supports 70° tilt and 360° rotation, AI-assisted defect classification, false alarm rate ＜0.5%.